DesignCon 2004 Channel Compliance Testing Utilizing Novel Statistical Eye Methodology
نویسنده
چکیده
New growth demands in the bandwidth requirements for short and long reach electrical channels have pushed the performance limitations of traditional linear passive interconnects such as high-speed backplanes and connectors. Most chip and system vendors regard 3Gbps data rates over copper as mature technology today and are rapidly prototyping 6Gbps and 10Gbps hardware. Original standardisation work for high-speed digital interfaces focused on defining the transmitter and receiver compliance in terms of eye diagram analysis utilizing masks and jitter tolerance. The remaining work of defining complete channel requirements is less accurately defined. As the bandwidth and crosstalk limits of the electrical interface are approached, the ultimate result is a degradation of bit error rate over the physical layer. This undesirable effect mandates the need to fully characterise the capability of the electrical channel from end-to-end. Traditional methods to simulate an emphasised transmitter, physical channel, and equalising receiver in the time domain or frequency domain are not sufficient. Low probability events can not be accurately modelled without long simulation times. To optimise the efficiency of simulations, a novel methodology based on statistical methods is introduced that allows fast and accurate compliance testing of differential channels. The following paper describes the algorithm and compares measurement results to a Matlab implementation of the algorithm using a design case study of 3Gbps and 6Gbps transmitter technology in 0.13um CMOS.
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